SOFT X-RAY SCANNING MICROSCOPY: ITS PRACTICAL USE FOR ELEMENTAL MAPPING AT THE NSLS U15 BEAMLINE

✍ Scribed by C. Jacobsen; J. M. Kenney; J. Kirz; I. McNulty; R. J. Rosser; F. Cinotti; H. Rarback; D. Shu

• Book ID: 114894834
• Publisher: John Wiley and Sons
• Year: 1986
• Tongue: English
• Weight: 486 KB
• Volume: 44
• Category: Article
• ISSN: 0031-8655
• DOI: 10.1111/j.1751-1097.1986.tb04688.x