Soft X-ray spectromicroscopy beamline at
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K.V. Kaznatcheev; Ch. Karunakaran; U.D. Lanke; S.G. Urquhart; M. Obst; A.P. Hitc
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Article
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2007
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Elsevier Science
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English
β 857 KB
The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100-2000 eV range and two end stations: scanning transmission X-ray