𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Soft X-ray resonant raman and resonant Auger spectra in SiK absorption edge

✍ Scribed by T. Kashiwakura; H. Arai; N. Kozuka; K. Odagawa; T. Yokohama; A. Kamata; S. Nakai

Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
279 KB
Volume
79
Category
Article
ISSN
0368-2048

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray K absorption spectra of silicon in
X-ray K absorption spectra of silicon in Si, SiO and SiO2
✍ C. Senemaud; M.T.Costa Lima; J.A. Roger; A. Cachard 📂 Article 📅 1974 🏛 Elsevier Science 🌐 English ⚖ 301 KB

X-ray absorption spectra of Si, SiO and SiOt in the Si K edge region are presented. They reveal a strong influence of the type of silicon bond on the structure of the absorption spectra situated towards high energies of the edge. These spectra show that the SiO oxide cannot be taken as a mixture of

Distortion of V 3d line shape due to Aug
Distortion of V 3d line shape due to Auger emission in resonant photoemission spectra of (V1−xCrx)2O3 at the V 2p→3d absorption edge
✍ S.-K. Mo; J.D. Denlinger; H.-D. Kim; J.W. Allen; A. Sekiyama; A. Yamasaki; S. Su 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 274 KB

We report high-resolution resonant photoemission spectra of (V 1Àx Cr x Þ 2 O 3 at the V 2p-3d edge. Distortion of the V 3d line shape due to Auger emission is observed in all phases, metal and insulating. Therefore, spectra that is not in the resonance photon energy range were used in making a rece