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X-ray K absorption spectra of silicon in Si, SiO and SiO2

โœ Scribed by C. Senemaud; M.T.Costa Lima; J.A. Roger; A. Cachard

Publisher
Elsevier Science
Year
1974
Tongue
English
Weight
301 KB
Volume
26
Category
Article
ISSN
0009-2614

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โœฆ Synopsis

X-ray absorption spectra of Si, SiO and SiOt in the Si K edge region are presented. They reveal a strong influence of the type of silicon bond on the structure of the absorption spectra situated towards high energies of the edge. These spectra show that the SiO oxide cannot be taken as a mixture of Si and SiOz.

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