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Resonant X-ray Raman scattering for Al, Si and their oxides

✍ Scribed by J. Szlachetko; M. Berset; J.-Cl. Dousse; K. Fennane; M. Szlachetko; R. Barrett; J. Hoszowska; A. Kubala-Kukus; M. Pajek

Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
165 KB
Volume
238
Category
Article
ISSN
0168-583X

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