Electrooptic Properties of SnSe Thin Fil
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S. S. Siddiqui; Dr. C. F. Desai
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Article
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1993
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John Wiley and Sons
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English
โ 205 KB
๐ 2 views
Tin monoselinide thin films were obtained by solid state reaction in vacuum. They were characterised by X-ray diffraction and subjected to resistivity and optical absorbance measurements. The data were analysed for obtaining activation energy and band gap. The effects of varying deposition parameter