Slip patterns and dislocation models of heavily doped silicon surfaces

✍ Scribed by Shockley, W.; Queisser, H.J.

• Book ID: 117903856
• Publisher: Institute of Electrical and Electronics Engineers
• Year: 1961
• Tongue: English
• Weight: 318 KB
• Volume: 8
• Category: Article
• ISSN: 0096-2430
• DOI: 10.1109/t-ed.1961.14850