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Size- and Orientation-Dependent Strain Effects on Ballistic Si p-Type Nanowire Field-Effect Transistors

✍ Scribed by Baykan, M. O.; Thompson, S. E.; Nishida, T.

Book ID: 120077576
Publisher: IEEE
Year: 2012
Tongue: English
Weight: 652 KB
Volume: 11
Category: Article
ISSN: 1536-125X
DOI: 10.1109/TNANO.2012.2222662

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