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[IEEE 2012 International Conference on Computers and Devices for Communication (CODEC) - Kolkata, India (2012.12.17-2012.12.19)] 2012 5th International Conference on Computers and Devices for Communication (CODEC) - Modeling of transport behavior of the ballistic Silicon nanowire gate-all-around field-effect-transistors (Si NWFETs) with Si/SiO2 interface roughness

โœ Scribed by Chowdhury, Basudev Nag; Chattopadhyay, Sanatan


Book ID
120604284
Publisher
IEEE
Year
2012
Weight
273 KB
Category
Article
ISBN
1467326186

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