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[IEEE 2012 International Conference on Computers and Devices for Communication (CODEC) - Kolkata, India (2012.12.17-2012.12.19)] 2012 5th International Conference on Computers and Devices for Communication (CODEC) - Modeling of transport behavior of the ballistic Silicon nanowire gate-all-around field-effect-transistors (Si NWFETs) with Si/SiO2 interface roughness

✍ Scribed by Chowdhury, Basudev Nag; Chattopadhyay, Sanatan

Book ID: 120604284
Publisher: IEEE
Year: 2012
Weight: 273 KB
Category: Article
ISBN: 1467326186
DOI: 10.1109/CODEC.2012.6509247

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