## Abstract The application of focused ion beam instrumentation in the generation of threeβdimensional microstructural data is described. The methodologies used to acquire and manipulate this data are explained, and the technique is illustrated by a number of examples from the material sciences. Th
β¦ LIBER β¦
Site-specific 3D imaging of cells and tissues with a dual beam microscope
β Scribed by Jurgen A.W. Heymann; Mike Hayles; Ingo Gestmann; Lucille A. Giannuzzi; Ben Lich; Sriram Subramaniam
- Book ID
- 116696767
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 916 KB
- Volume
- 155
- Category
- Article
- ISSN
- 1047-8477
No coin nor oath required. For personal study only.
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