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Single-fault fault-collapsing analysis in sequential logic circuits

✍ Scribed by Chen, J.E.; Lee, C.L.; Shen, W.Z.


Book ID
119777549
Publisher
IEEE
Year
1991
Tongue
English
Weight
992 KB
Volume
10
Category
Article
ISSN
0278-0070

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An algorithm for stuck-at fault coverage analysis of digital logic circuits is presented. Based on a recently developed stuck-at fault model, the algorithm determines the effectiveness of a given test input set. The algorithm is applicable for studying sequential logic circuits, as well as combinati