Single-Event Burnout Hardening of Power UMOSFETs With Optimized Structure

✍ Scribed by Wang, Ying; Zhang, Yue; Wang, Li-Guo; Yu, Chenghao

• Book ID: 121186149
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 786 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/TED.2013.2256426