✦ LIBER ✦
Simulation study of single-event gate rupture using radiation-hardened stripe cell power mosfet structures
✍ Scribed by Titus, J.L.; Yen-Sheng Su, ; Savage, M.W.; Mickevicius, R.V.; Wheatley, C.F.
- Book ID
- 111859028
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 634 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9499
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