๐”– Bobbio Scriptorium
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Research of Single-Event Burnout in Power UMOSFETs

โœ Scribed by Wang, Ying; Zhang, Yue; Yu, Chenghao


Book ID
121202815
Publisher
IEEE
Year
2013
Tongue
English
Weight
384 KB
Volume
60
Category
Article
ISSN
0018-9383

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