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Single-Event Burnout and Avalanche Characteristics of Power DMOSFETs

โœ Scribed by Liu, Sandra; Boden, Milton; Girdhar, Dev Alok; Titus, Jeffrey L.


Book ID
119994765
Publisher
IEEE
Year
2006
Tongue
English
Weight
396 KB
Volume
53
Category
Article
ISSN
0018-9499

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