Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs

✍ Scribed by Liu, Sandra; Marec, Ronan; Sherman, Phillip; Titus, Jeffrey L.; Bezerra, Francoise; Ferlet-Cavois, Véronique; Marin, Marc; Sukhaseum, Nicolas; Widmer, Fabien; Muschitiello, Michele; Gouyet, Lionel; Ecoffet, Robert; Zafrani, Max

• Book ID: 121230840
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 928 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2177863