A Double-Power-MOSFET Circuit for Protection From Single Event Burnout

✍ Scribed by Barak, Joseph; Haran, Avner; David, David; Rapaport, Shimshon

• Book ID: 115453075
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 328 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2008.2007486