✦ LIBER ✦
A physical interpretation for the single-event-gate-rupture cross-section of n-channel power MOSFETs
✍ Scribed by Johnson, G.H.; Galloway, K.F.; Schrimpf, R.D.; Titus, J.L.; Wheatley, C.F.; Allenspach, M.; Dachs, C.
- Book ID
- 118251733
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 643 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0018-9499
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