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Single-crystal X-ray diffraction analysis of nonplanar autoepitaxial silicon layers

✍ Scribed by V. T. Bublik; L. V. Kozhitov; T. T. Kondratenko


Book ID
110166659
Publisher
SP MAIK Nauka/Interperiodica
Year
2009
Tongue
English
Weight
285 KB
Volume
45
Category
Article
ISSN
0020-1685

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