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Simultaneous film thickness measurement and wall temperature assessment by Low-Coherence Interferometry

✍ Scribed by Borgetto, Nicolas; André, Frédéric; Galizzi, Cédric; Escudié, Dany

Book ID: 122566288
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 626 KB
Volume: 44
Category: Article
ISSN: 0894-1777
DOI: 10.1016/j.expthermflusci.2012.08.013

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