๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Simulation Study of Dominant Statistical Variability Sources in 32-nm High- /Metal Gate CMOS

โœ Scribed by Xingsheng Wang; Roy, G.; Saxod, O.; Bajolet, A.; Juge, A.; Asenov, A.


Book ID
114572715
Publisher
IEEE
Year
2012
Tongue
English
Weight
271 KB
Volume
33
Category
Article
ISSN
0741-3106

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES