Low-Frequency Noise Investigation and Noise Variability Analysis in High-/Metal Gate 32-nm CMOS Transistors

✍ Scribed by Lopez, D.; Haendler, S.; Leyris, C.; Bidal, G.; Ghibaudo, G.

• Book ID: 114620482
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 553 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2141139