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Simulation of near-field scanning optical microscopy using a plasmonic gap probe

✍ Scribed by Tanaka, Kazuo; Tanaka, Masahiro; Katayama, Kiyofumi

Book ID: 115406720
Publisher: Optical Society of America
Year: 2006
Tongue: English
Weight: 321 KB
Volume: 14
Category: Article
ISSN: 1094-4087
DOI: 10.1364/OE.14.010603

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Jongsuck Bae (A'94-M'94-SM'98) was born in Nagoya, Japan, in 1953. He received the B.Eng. degree in electric engineering from the Korean University, Tokyo, Japan, in 1976, and the D.Eng. degree in electronic engineering from Tohoku University, Sendai, Japan, in 1990.In 1977, he joined the Research I