✦ LIBER ✦

Simulation of degradation of dielectric breakdown field of thermal SiO2 films due to voids in Si wafers

✍ Scribed by Satoh, Y.; Shiota, T.; Furuya, H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Time-dependent dielectric breakdown of S

✍ A Teramoto; H Umeda; K Azamawari; K Kobayashi; K Shiga; J Komori; Y Ohno; A Shig 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 333 KB

Statistics of electrical breakdown field

✍ Sire, Cédric; Blonkowski, Serge; Gordon, Michael J.; Baron, Thierry 📂 Article 📅 2007 🏛 American Institute of Physics 🌐 English ⚖ 481 KB