✦ LIBER ✦
Statistics of electrical breakdown field in HfO[sub 2] and SiO[sub 2] films from millimeter to nanometer length scales
✍ Scribed by Sire, Cédric; Blonkowski, Serge; Gordon, Michael J.; Baron, Thierry
- Book ID
- 120939800
- Publisher
- American Institute of Physics
- Year
- 2007
- Tongue
- English
- Weight
- 481 KB
- Volume
- 91
- Category
- Article
- ISSN
- 0003-6951
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