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Simulated fault injection methodology for gate-level quantum circuit reliability assessment

✍ Scribed by Mihai Udrescu; Lucian Prodan; Mircea Vlăduţiu

Book ID: 113902647
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 725 KB
Volume: 23
Category: Article
ISSN: 1569-190X
DOI: 10.1016/j.simpat.2012.01.001

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