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[IEEE 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - Paris, France (2013.06.16-2013.06.19)] 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS) - A methodology for system-level fault injection based on gate-level faulty behavior

✍ Scribed by Robache, R.; Boland, J.-F.; Thibeault, C.; Savaria, Y.

Book ID: 120861322
Publisher: IEEE
Year: 2013
Weight: 703 KB
Category: Article
ISBN: 1479906182
DOI: 10.1109/NEWCAS.2013.6573663

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