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Simple Method for the Determination of the Doping Profile in MIS Structures with Implanted Shallow p-n Junction

โœ Scribed by Lysenko, V. S. ;Nazarov, A. N. ;Rudenko, T. E.

Publisher
John Wiley and Sons
Year
1985
Tongue
English
Weight
263 KB
Volume
91
Category
Article
ISSN
0031-8965

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