Silicon-Based Millimetre-wave Technology, Volume 174

✍ Scribed by Jamal Deen

• Publisher: Academic Press
• Year: 2012
• Tongue: English
• Leaves: 509
• Series: Advances in Imaging and Electron Physics
• Edition: 1
• Category: Library

✦ Synopsis

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

✦ Table of Contents

Editor-In-Chief
......Page 1
ADVANCES IN IMAGING AND ELECTRON PHYSICS
......Page 2
Copyright......Page 3
PREFACE......Page 4
FUTURE CONTRIBUTIONS......Page 5
FOREWORD......Page 9
CONTRIBUTORS......Page 11
ACKNOWLEDGEMENTS......Page 13
PERMISSION ACKNOWLEDGMENTS......Page 14
References......Page 131
Color Plates......Page 471
A......Page 486
C......Page 487
E......Page 489
I......Page 490
L......Page 491
M......Page 492
N......Page 494
P......Page 495
R......Page 496
S......Page 497
T......Page 501
W......Page 503
Z......Page 504
Volume 153......Page 505
Volume 159......Page 506
Volume 164......Page 507
Volume 169......Page 508
Volume 173......Page 509