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Silicon-Based Millimeter-wave Technology: Measurement, Modeling and Applications

✍ Scribed by M. Jamal Deen (Eds.)


Publisher
Academic Press
Year
2012
Tongue
English
Leaves
509
Series
Advances in Imaging and Electron Physics 174
Edition
1
Category
Library

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✦ Synopsis


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

✦ Table of Contents


Content:
Editor-In-Chief
Page ii

Front Matter
Page iii

Copyright
Page iv

Preface
Page ix
Peter Hawkes

Future Contributions
Pages xi-xiv

Foreword
Pages xv-xvi

Contributors
Pages xvii-xviii

Acknowledgements
Page xix

Permission Acknowledgments
Page xx

Chapter One - Measurement Techniques and Issues
Pages 1-117
M. Jamal Deen, Ognian Marinov

Chapter Two - Transmission Lines and Passive Components
Pages 119-222
Guennadi A. Kouzaev, M. Jamal Deen, Natalia K. Nikolova

Chapter Three - Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping
Pages 223-260
Mohamed H. Bakr, Mohamed H. Negm

Chapter Four - Nanoscale FETs
Pages 261-347
Oana Moldovan, Antonio LΓ‘zaro, FranΓ§ois Danneville, Rodrigo Picos, Bogdan Nae, Benjamin Iniguez, M. Jamal Deen

Chapter Five - RF MEMS Devices for Communication Systems
Pages 349-390
M. Daneshmand, R.R. Mansour

Chapter Six - Substrate-Integrated Antennas on Silicon
Pages 391-458
Natalia K. Nikolova, Maryam Ravan, Reza K. Amineh

Color Plates
Pages 1-15

Subject Index
Pages 459-477

Contents of Volumes 151-173
Pages 479-483


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