Silicon Analog Components: Device Design, Process Integration, Characterization, and Reliability

✍ Scribed by Badih El-Kareh, Lou N. Hutter (auth.)

• Publisher: Springer-Verlag New York
• Year: 2015
• Tongue: English
• Leaves: 634
• Edition: 1
• Category: Library

✦ Synopsis

This book covers modern analog components, their characteristics, and interactions with process parameters. It serves as a comprehensive guide, addressing both the theoretical and practical aspects of modern silicon devices and the relationship between their electrical properties and processing conditions. Based on the authors’ extensive experience in the development of analog devices, this book is intended for engineers and scientists in semiconductor research, development and manufacturing. The problems at the end of each chapter and the numerous charts, figures and tables also make it appropriate for use as a text in graduate and advanced undergraduate courses in electrical engineering and materials science.

✦ Table of Contents

Front Matter....Pages i-xli
The World Is Analog....Pages 1-24
Review of Single-Crystal Silicon Properties....Pages 25-63
PN Junctions....Pages 65-109
Rectifying and Ohmic Contacts....Pages 111-146
Bipolar and Junction Field-Effect Transistors....Pages 147-204
Analog/RF CMOS....Pages 205-274
High-Voltage and Power Transistors....Pages 275-356
Passive Components....Pages 357-409
Process Integration....Pages 411-456
Mismatch and Noise....Pages 457-501
Chip Reliability....Pages 503-581
Back Matter....Pages 583-607

✦ Subjects

Circuits and Systems; Electronic Circuits and Devices; Optical and Electronic Materials