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Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

✍ Scribed by S. Abhaya; G. Amarendra; S. Kalavathi; Padma Gopalan; M. Kamruddin; A.K. Tyagi; V.S. Sastry; C.S. Sundar

No coin nor oath required. For personal study only.

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