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Investigation of interdiffusion in thin film couples of aluminum and copper by Auger electron spectroscopy

✍ Scribed by M.P. Shearer; C.L. Bauer; A.G. Jordan

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 421 KB
Volume: 61
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(79)90471-1

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