Observation of a marker shift in a Cu-Sn thin film diffusion couple by Auger electron spectroscopy methods

✍ Scribed by R. Chopra; M. Ohring; R.S. Oswald

• Publisher: Elsevier Science
• Year: 1981
• Tongue: English
• Weight: 255 KB
• Volume: 86
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(81)90156-5