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SiGe materials characterized by high resolution Raman spectroscopy and spectroscopic ellipsometry

✍ Scribed by P. Evrard; J.L. Stehle; C. Pickering; R.T. Carline

Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
300 KB
Volume
222
Category
Article
ISSN
0040-6090

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