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Aperture based Raman spectroscopy on SiGe film structures with high spatial resolution

✍ Scribed by A. Mai; L. Zhu; M. Hecker; J. Rinderknecht; C. Georgi; Y. Ritz; E. Zschech


Publisher
John Wiley and Sons
Year
2008
Tongue
English
Weight
242 KB
Volume
39
Category
Article
ISSN
0377-0486

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