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Side-selective and non-destructive determination of the critical current density of double-sided superconducting thin films

✍ Scribed by H. Hochmuth; M. Lorenz

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 482 KB
Volume: 265
Category: Article
ISSN: 0921-4534
DOI: 10.1016/0921-4534(96)00303-6

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