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Non-destructive measurement of the critical current and the current carrying length scale in superconducting crystals and films

โœ Scribed by MA Angadi; AD Caplin; JR Laverty; ZX Shen; P. Tonolo

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
230 KB
Volume
185-189
Category
Article
ISSN
0921-4534

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