✦ LIBER ✦
Interfacial Strain-Induced Oxygen Disorder as the Cause of Enhanced Critical Current Density in Superconducting Thin Films
✍ Scribed by Stuart C. Wimbush; Meicheng Li; Mary E. Vickers; Boris Maiorov; D. Matt Feldmann; Quanxi Jia; Judith L. MacManus-Driscoll
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 583 KB
- Volume
- 19
- Category
- Article
- ISSN
- 1616-301X
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