✦ LIBER ✦

Si0.5Ge0.5 bulk single crystals with uniform composition

✍ Scribed by K. Kinoshita; H. Miyata; R. Tanaka; T. Ueda; Y. Arai; S. Yoda

Book ID: 116630299
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 653 KB
Volume: 349
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2012.04.001

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Homogeneous Si0.5Ge0.5 bulk crystal grow

Homogeneous Si0.5Ge0.5 bulk crystal growth as substrates for strained Ge thin films by the traveling liquidus-zone method

✍ Kyoichi Kinoshita; Osamu Nakatsuka; Shinichi Yoda; Shigeaki Zaima 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 871 KB

Tunneling field-effect transistor with a

Tunneling field-effect transistor with a strained Si channel and a Si0.5Ge0.5 source

✍ Q.T. Zhao; W.J. Yu; B. Zhang; M. Schmidt; S. Richter; D. Buca; J.-M. Hartmann; R 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 806 KB

Ce3Mg0.5GeS7 from single-crystal data

✍ Gulay, L. D. ;Daszkiewicz, M. ;Huch, M. R. ;Pietraszko, A. 📂 Article 📅 2007 🏛 International Union of Crystallography 🌐 English ⚖ 551 KB

Single crystals of tricerium hemimagnesium germanium heptasulfide were obtained by sintering a Ce~2~S~3~–MgS–GeS~2~ mixture. The compound crystallizes in the space group __P__6~3~ and is isotypic with other Ln~3~ __T__ ~0.5~ __X__S~7~ phases (Ln = lanthanide, __T__ = divalent transition metal, and _

Work-hardening of Fe, Fe-0·5 wt% Si and

Work-hardening of Fe, Fe-0·5 wt% Si and Fe-0·9 wt% Si single crystals

✍ V. Novák; K. Z. Saleeb; S. Kadečková; B. Šesták 📂 Article 📅 1976 🏛 Springer 🌐 English ⚖ 591 KB

Low-temperature Au-induced crystallizati

Low-temperature Au-induced crystallization of hydrogenated amorphous Si0.5Ge0.5 thin films using Au solution

✍ Shanglong Peng; Xiaoyan Shen; Zeguo Tang; Deyan He 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 560 KB

Picosecond carrier dynamics in a-Si0.5Ge

Picosecond carrier dynamics in a-Si0.5Ge0.5:H measured with a free-electron laser

✍ Fauchet, P.M.; Young, D.A.; Nighan, W.L., Jr.; Fortmann, C.M. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 436 KB