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Sensitivity of plane wave topography to microdefects

✍ Scribed by Köhler, R. ;Möhling, W.

Book ID: 105377081
Publisher: John Wiley and Sons
Year: 1983
Tongue: English
Weight: 730 KB
Volume: 78
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210780216

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