✦ LIBER ✦
Imaging of microdefects in silicon single crystals by plane wave X-r ay topography at asymmetric diffraction
✍ Scribed by Voloshin, A. E. ;Smolskii, I. L. ;Kaganer, V. M. ;Indenbom, V. L. ;Rozhanskii, V. N.
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 883 KB
- Volume
- 130
- Category
- Article
- ISSN
- 0031-8965
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