## Abstract The sensitivity and measurement errors of both qualitative and quantitative (grid‐projection) Makyoh topography (MT) are analysed using analytic calculations and computer simulations. The essential difference between the two versions is pointed out. For qualitative MT, the sensitivity i
Sensitivity of Makyoh topography
✍ Scribed by Ferenc Riesz
- Book ID
- 103846448
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 221 KB
- Volume
- 9
- Category
- Article
- ISSN
- 1369-8001
No coin nor oath required. For personal study only.
✦ Synopsis
The sensitivity of both qualitative and quantitative (grid-projection) Makyoh topography is analysed using analytic calculations. The essential difference between the two versions is pointed out. The sensitivity is defined on the analogy of the modulation transfer function and is expressed in terms of instrumental parameters and the detection limits of the imaging sensor in an analytic form. It is shown that the qualitative version is more sensitive than the quantitative one for surface features having small spatial wavelength. The effects of small-scale surface roughness and non-ideal collimation of the illumination is considered and it is shown that these effects decrease the sensitivity.
📜 SIMILAR VOLUMES
A Makyoh-topography study of the removal of processed Si circuits by etching and lapping / polishing for substrate re-use is reported. Removal of the individual circuit layers (oxide, metal) causes a uniform change in the overall wafer curvature, corresponding to strain release. Lapping / polishing