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Sensitivity Enhancement of Metal Oxide Thin Film Transistor with Back Gate Biasing

✍ Scribed by V.A.T. Dam; M.A. Blauw; S.H. Brongersma; M. Crego-Calama

Book ID: 119355515
Publisher: Elsevier
Year: 2011
Tongue: English
Weight: 252 KB
Volume: 25
Category: Article
ISSN: 1877-7058
DOI: 10.1016/j.proeng.2011.12.028

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