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Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures

✍ Scribed by Jae Chul Park; Ho-Nyeon Lee


Book ID
119227590
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
372 KB
Volume
33
Category
Article
ISSN
0141-9382

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