Sensitivity Analysis on Indium Phosphide Liquid Encapsulated Czochralski Growth
β Scribed by M. Masi; S. Fogliani; S. Carra
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 213 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0232-1300
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β¦ Synopsis
The optimization of the InP liquid encapsulated Czochralski systems is usually difficult, time consuming and very expensive. Here, the relative importance of the different growth parameters (e.g., pull rate, system temperatures and geometry) on the growth interface deflection, the temperature gradients within the melt and the crystal and the dislocation density has been investigated through a sensitivity analysis. The sensitivity coefficients have been calculated by means of a mathematical model, previously validated, based on the thermoelastic theory for the dislocation formation and on the thermal capillary theory for the temperature field within the system. The crucible temperature profile has been selected as the more important parameter to control the crystal quality during the growth.
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## Abstract The results of threeβdimensional unsteady modeling of melt turbulent convection with prediction of the crystallization front geometry in liquid encapsulated Czochralski growth of InP bulk crystals and vapor pressure controlled Czochralski growth of GaAs bulk crystals are presented. The
By the hand of a stationary system-oriented model of t h c InP crystal growth (LEC) various regimes of heat input into the melt are demonstrated. They are compared by regarding their influence over the maximal temperature of the melt, the curvature of the crystallization front, and the temperature o