A model is de¨eloped considering the substrate effect, fringing field effect, and gate and drain contact pad effect to e¨aluate the scattering parameters for a short-gate-length insulated gate field-effect transistor by extracting the admittance parameters for its microwa¨e frequency applications. T
Sensitivity analysis of the effective parameter extraction procedure for metamaterial applications
β Scribed by Varun Tyagi; Elena Semouchkina
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 315 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0895-2477
No coin nor oath required. For personal study only.
β¦ Synopsis
Abstract
We examine the accuracy of metamaterial effective parameters extraction from the reflection and transmission data and show that this procedure could lead to significant errors in the effective permittivity and permeability values near frequencies where the reflection coefficient has low magnitudes, while the refractive index can still be accurately extracted. Β© 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 1013β1017, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.24267
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