๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Sensitivity amplication by sample preconcentration in ion beam analysis

โœ Scribed by H.J. Annegarn; C.S. Erasmus; J.P.F. Sellschop; M. Tredoux

Publisher
Elsevier Science
Year
1983
Weight
411 KB
Volume
218
Category
Article
ISSN
0167-5087

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Determination of trace metal ions in wat
Determination of trace metal ions in water samples by on-line preconcentration and inductively coupled plasma mass spectrometry
โœ Hueih-Jen Yang; Kuang-Shie Huang; Shiuh-Jen Jiang; Cheng-Chang Wu; Chin-Hsing Ch ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 606 KB

An on-line sample pretreatment method was developed to preconcentrate trace metal ions from water samples. complexes of metal ions with butane-2,3-dione bis(N-pyridinoacetyt hydrazone) were retained on a column packed with Amberlite XAD-4 resin at pH 8-9. The metal complexes were removed from the co

High-sensitivity SIMS analysis of carbon
High-sensitivity SIMS analysis of carbon in GaN films by molecular ion detection
โœ Takakuwa-Hongo, C.; Tomita, M. ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 299 KB

The improvement of the detection sensitivity of carbon in GaN thin รlms was investigated. Using the molecular ion CN-in SIMS, the secondary ion yields were increased greatly, and the detection limit was improved by more than two orders of magnitude. The reason for this is that the molecule CN has a