In situ characterization of rare earth-CdTe heterostructures by ion beam analysis

Depth Profiling by Ion Beams Analysis Te

Depth Profiling by Ion Beams Analysis Techniques for the Characterization of Interdiffusion in Multilayered Au-Al Systems

✍ Markwitz, A.; Demortier, G. 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 668 KB

Ion beam analysis (IBA) methods were used for the characterization of interdiffusion in thin Au-A1 multilayered systems. Conventional RBS with a high depth resolution at the specimen surface and at the interfaces (e.g. 14 nm in the depth of 255 nm) was used for gold depth profiling. In contrast to g