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Semiconductor Properties of Polycrystalline CuBr by Hall Effect and Capacitive Measurements

✍ Scribed by Knauth, P. ;Massiani, Y. ;Pasquinelli, M.

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 193 KB
Volume: 165
Category: Article
ISSN: 0031-8965
DOI: 10.1002/(sici)1521-396x(199802)165:2<461::aid-pssa461>3.0.co;2-w

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